Radiometry of intense XUV/X-ray radiation

The determination of soft X-ray/XUV radiation dose represents a complex, difficult problem due to the high local doses delivered, which can damage the detector’s surface and/or overload the detector. A detector head equipped with a silicon photodiode and thermoluminescent dosimeters (TLDs) has been developed for checking the measurement of high fluxes of soft X-rays. CVD diamonds with well-defined surface quality have been tested as possible TLDs for soft X-ray diagnostics. So far, only one type of CVD diamond has been demonstrated to be usable: CVDITE-CDM (Element Six Company), a non-transparent freestanding cutting material.

Recent publications

J. Krása, A. Cejnarová, L. Juha, L. Ryc, M. Scholz, P. Kubeš: Semiconductor and thermoluminescent dosimetry of pulsed soft X-ray plasma sources, Rad. Prot. Dosim. 100, 429–432 (2002).

L. Ryc, J. Badziak, L. Juha, J. Krása, B. Králiková, L. Láska, P. Parys, M. Pfeifer, K. Rohlena, J. Skala, W. Slysz, J. Ullschmied, M. Wegrzecki, J. Wolowski: The use of silicon photodiodes for x-ray diagnostics in the PALS plasma experiments, Plasma Phys. Control. Fusion 45, 1079–1086 (2003).

J. Krása, L. Juha, A. Cejnarová, V. Vorlíček: Application of CVD diamonds as dosimeters of soft X-ray emission from plasma sources, Nucl. Instrum. Meth. Phys. Res. A524, 332–339 (2004).

Equipment

Harshaw PC-controlled TL reader

Collaborators

Institute of Plasma Physics and Laser Microfusion, Ul. Hery 23, PL-00-908 Warsaw, Poland: Leszek Ryc